Reference Type | Journal (article/letter/editorial) |
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Title | Minor and trace element analysis of natural zircon (ZrSiO4) by SIMS and laser ablation ICPMS: A consideration and comparison of two broadly competitive techniques. |
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Journal | Journal of Trace and Microprobe Techniques |
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Authors | Hoskin, P.W.O. | Author |
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Year | 1998 | Volume | < 16 > |
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Page(s) | 301-326 |
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Original Entry | Hoskin, P.W.O. (1998): Minor and trace element analysis of natural zircon (ZrSiO4) by SIMS and laser ablation ICPMS: A consideration and comparison of two broadly competitive techniques. J. Trace Microprobe Tech., 16, 301–326. |
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Classification | Not set | LoC | Not set |
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Mindat Ref. ID | 16128958 | Long-form Identifier | mindat:1:5:16128958:4 |
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GUID | 1c47be31-7c73-4832-948e-4589a44fbff1 |
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Full Reference | Hoskin, P.W.O. (1998) Minor and trace element analysis of natural zircon (ZrSiO4) by SIMS and laser ablation ICPMS: A consideration and comparison of two broadly competitive techniques. Journal of Trace and Microprobe Techniques, 16. 301-326 |
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Plain Text | Hoskin, P.W.O. (1998) Minor and trace element analysis of natural zircon (ZrSiO4) by SIMS and laser ablation ICPMS: A consideration and comparison of two broadly competitive techniques. Journal of Trace and Microprobe Techniques, 16. 301-326 |
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In | Link this record to the correct parent record (if possible) |
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