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Hoskin, P.W.O. (1998) Minor and trace element analysis of natural zircon (ZrSiO4) by SIMS and laser ablation ICPMS: A consideration and comparison of two broadly competitive techniques. Journal of Trace and Microprobe Techniques, 16. 301-326

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Reference TypeJournal (article/letter/editorial)
TitleMinor and trace element analysis of natural zircon (ZrSiO4) by SIMS and laser ablation ICPMS: A consideration and comparison of two broadly competitive techniques.
JournalJournal of Trace and Microprobe Techniques
AuthorsHoskin, P.W.O. Author
Year1998Volume<   16   >
Page(s)301-326
Original EntryHoskin, P.W.O. (1998): Minor and trace element analysis of natural zircon (ZrSiO4) by SIMS and laser ablation ICPMS: A consideration and comparison of two broadly competitive techniques. J. Trace Microprobe Tech., 16, 301–326.
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Mindat Ref. ID16128958Long-form Identifiermindat:1:5:16128958:4
GUID1c47be31-7c73-4832-948e-4589a44fbff1
Full ReferenceHoskin, P.W.O. (1998) Minor and trace element analysis of natural zircon (ZrSiO4) by SIMS and laser ablation ICPMS: A consideration and comparison of two broadly competitive techniques. Journal of Trace and Microprobe Techniques, 16. 301-326
Plain TextHoskin, P.W.O. (1998) Minor and trace element analysis of natural zircon (ZrSiO4) by SIMS and laser ablation ICPMS: A consideration and comparison of two broadly competitive techniques. Journal of Trace and Microprobe Techniques, 16. 301-326
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Zircon


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